Abnormality determination device and abnormality determination method
AssigneeNissan Motor Co., Ltd.
InventorYasuhiro Tanaka
Life of this patent
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Abstract
An abnormality determination device includes a control unit for determining an abnormality of a robot, the control unit being configured to calculate a measurement probability distribution which is a probability distribution using disturbance torque acquired during a predetermined period as a random variable. The control unit causes an average of the calculated measurement probability distribution to conform to an average of an evaluation normal model which is a predetermined probability distribution, compares the measurement probability distribution with the evaluation normal model of which the respective averages conform to each other, and determines an abnormality of the robot in accordance with a result of the comparison.
Claims11
An abnormality determination device comprising a controller for determining an abnormality of an apparatus including a movable part in accordance with pieces of data regarding a state of the apparatus acquired from a sensor installed in the apparatus, the controller being configured to:
- calculate a measurement probability distribution which is a probability distribution using the data acquired during a past predetermined period as a random variable;
- cause reference points of the measurement probability distribution and an evaluation normal model to conform to each other, the evaluation normal model being created by use of the data acquired during a period before the predetermined period excluding the data determined to be abnormal;
- compare the measurement probability distribution with the evaluation normal model of which the respective reference points conform to each other;
- and
- determine the abnormality of the apparatus in accordance with a result of the comparison.
An abnormality determination method of determining an abnormality of an apparatus including a movable part in accordance with pieces of data regarding a state of the apparatus acquired from a sensor installed in the apparatus, the method comprising:
- calculating a measurement probability distribution which is a probability distribution using the data acquired during a past predetermined period as a random variable;
- causing reference points of the measurement probability distribution and an evaluation normal model to conform to each other, the evaluation normal model being created by use of the data acquired during a period before the predetermined period excluding the data determined to be abnormal;
- comparing the measurement probability distribution with the evaluation normal model of which the respective reference points conform to each other;
- and
- determining the abnormality of the apparatus in accordance with a result of the comparison.
Dependencies are inferred from the claim text.