Method for determining a parameter of a processing process and processing machine
AssigneeTRUMPF Werkzeugmaschinen GmbH + Co. KG
InventorsBoris Regaard, Winfried Magg
Life of this patent
Estimating the term…
Abstract
A method determines at least one parameter for a process quality during a processing process. The method includes: processing a workpiece while moving a processing tool and the workpiece relative to one another; monitoring a region on the workpiece; determining the at least one parameter for the process quality based on the monitored region; and determining at least one position-dependent parameter for the process quality based on a plurality of measured values of the at least one parameter at a same processing position, or determining at least one direction-dependent parameter for the process quality based on the plurality of measured values of the at least one parameter in a same processing direction.
Claims19
A method for determining at least one parameter for a process quality during a processing process, the method comprising:
- processing a workpiece while moving a processing tool and the workpiece relative to one another;
- monitoring a region on the workpiece;
- determining the at least one parameter for the process quality based on the monitored region;
- and
- determining at least one position-dependent parameter for the process quality based on a plurality of measured values of the at least one parameter at a same processing position, or determining at least one direction-dependent parameter for the process quality based on the plurality of measured values of the at least one parameter in a same processing direction.
A processing machine, the processing machine comprising:
- a processing tool configured for processing of a workpiece;
- a movement device configured to move the processing tool and the workpiece relative to one another;
- a monitoring device configured to monitor a region on the workpiece;
- and
- an evaluation device, which is configured to determine at least one parameter for a process quality based on the monitored region,
- wherein the evaluation device is configured to determine at least one position-dependent parameter for the process quality based on a plurality of measured values of the at least one parameter at a same processing position, or at least one direction-dependent parameter for the process quality based on the plurality of measured values of the at least one parameter along a same processing direction.
Dependencies are inferred from the claim text.