Ion sources with improved cleaning by ablating light
OwnerJohn Mark ALLISON, Diana Vladimirovna KALININAinventors
Life of this patent
Estimating the term…
Abstract
An ion source comprises an ionising light source arranged to output ionising light for ionising a sample material, an electrode presenting an electrode surface for attracting the ionised sample material and upon which contaminant material is able to accumulate, and an ablating light source arranged to output an ablating light beam or pulse(s) for ablating material of the electrode from the electrode surface. The ablating light beam or pulse(s) does not include said ionising light. A reflector for reflecting the ablating light onto the electrode surface, therewith by a process of ablation a part of the electrode surface is removable from the electrode together with contaminant material when accumulated upon that part.
Claims19
An ion source for a mass spectrometer for generating ions of a sample material comprising:
- an ionising light source arranged to output ionising light for ionising the sample material;
- an electrode presenting an electrode surface for attracting the ionised sample material and upon which contaminant material is able to accumulate;
- an ablating light source arranged to output an ablating light beam or pulse(s) for ablating material of the electrode from the electrode surface, wherein the ablating light beam or pulse(s) does not include said ionising light;
- a reflector for reflecting the ablating light onto the electrode surface, therewith by a process of ablation a part of the electrode surface is removable from the electrode together with said contaminant material when accumulated upon that part.
A method for cleaning an ion source of a mass spectrometer for generating ions of a sample material, the ion source comprising an ionising light source arranged to output ionising light for ionising the sample material, and an electrode presenting an electrode surface for attracting the ionised sample material and upon which contaminant material is able to accumulate, the method including;
- generating an ablating light beam or pulse(s) for ablating material of the electrode from the electrode surface, wherein the ablating light beam or pulse(s) does not include said ionising light;
- reflecting, by a reflector, the ablating light beam or pulse(s) onto the electrode surface, therewith by a process of ablation removing a part of the electrode surface from the electrode together with said contaminant material when accumulated upon that part.
Dependencies are inferred from the claim text.