Method and device for determining whether object includes defect
AssigneeWistron Corporation
InventorCheng-Wei Lin
Life of this patent
Estimating the term…
Abstract
A method and device for determining whether an object includes a defect are provided. The method includes the following steps. A tested image of a tested object is obtained. Selected good product sample data corresponding to the tested object is obtained. A dissimilarity value between the tested image and the selected good product sample data is calculated by using a dissimilarity model, and whether the tested object is a good product or a defective product is determined according to the dissimilarity value.
Claims19
A method for determining whether an object comprises a defect, comprising:
- obtaining a tested image of a tested object;
- obtaining selected good product sample data corresponding to the tested object;
- and
- calculating a dissimilarity value between the tested image and the selected good product sample data by using a dissimilarity model, and determining whether the tested object is a good product or a defective product according to the dissimilarity value.
A device for determining whether an object comprises a defect, comprising:
- an object database, possessing at least one piece of good product sample data corresponding to multiple objects;
- an image source device, configured to obtain a tested image of a tested object;
- and
- a processor, coupled to the object database and the image source device,
- wherein the processor obtains the tested image of the tested object by using the image source device, and obtains selected good product sample data corresponding to the tested object by using the object database, and
- the processor calculates a dissimilarity value between the tested image and the selected good product sample data by using a dissimilarity model, and determines whether the tested object is a good product or a defective product according to the dissimilarity value.
Dependencies are inferred from the claim text.