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US 2021/0200651 A1Published application
Method and apparatus for performing test for cpu, and electronic device
AssigneeZhengzhou Yunhai Information Technology Co., Ltd.
InventorDeli SHI
Life of this patent
Estimating the term…
Abstract
A method and an apparatus for performing a test for a CPU, and an electronic device. A decay command in a SETWP test and a command-executing duration corresponding to each command subsequent to the decay command can be automatically deployed. Thereby, the SETWP test is correctly performed for the CPU to obtain a test result. It is not necessary to rely on manual adjustment on a parameter of a delay corresponding to each command.
Claims10
A method for performing a test for a CPU, comprising:
- executing a SETWP test for a CPU, determining a first command-executing duration corresponding to a decay command in the SETWP test, and deploying the first command-executing duration;
- executing the SETWP test again, and adjusting a command-executing duration corresponding to each command subsequent to the decay command in the SETWP test;
- executing the SETWP test again to acquire test data, and determining whether the CPU meets a requirement according to the test data;
- wherein the test data comprises a temporal difference between a moment at which an earliest rising edge appears in a generated cso signal and a moment at which each falling edge appears in a generated alert signal.
1 more element
An apparatus for performing a test for a CPU, comprising:
- a first deploying module, configured to execute a SETWP test for a CPU, determine a first command-executing duration corresponding to a decay command in the SETWP test, and deploy the first command-executing duration;
- a second deploying module, configured to execute the SETWP test again, and adjust a command-executing duration corresponding to each command subsequent to the decay command in the SETWP test;
- a data acquiring module, configured to execute the SETWP test again to acquire test data, and determine whether the CPU meets a requirement according to the test data;
- and
- wherein the test data comprises a temporal difference between a moment at which an earliest rising edge appears in a generated cso signal and a moment at which each falling edge appears in a generated alert signal.
2 more elements
An electronic device, comprising:
- a memory, configured to store a program, and
- a processor, configured to invoke the program for:
- executing a SETWP test for a CPU, determining a first command-executing duration corresponding to a decay command in the SETWP test, and deploying the first command-executing duration;
- executing the SETWP test again, and adjusting a command-executing duration corresponding to each command subsequent to the decay command in the SETWP test;
- executing the SETWP test again to acquire test data, and determining whether the CPU meets a requirement according to the test data;
- wherein the test data comprises a temporal difference between a moment at which an earliest rising edge appears in a generated cso signal and a moment at which each falling edge appears in a generated alert signal.
3 more elements
Dependencies are inferred from the claim text.