Controlled-emissivity face heated by non-resistive heat source
AssigneeHewlett-Packard Development Company, L.P.
InventorsJoshua Peter YASBEK, Todd GOYEN, David SORIANO FOSAS, Asa WEISS, Arthur H. BARNES
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Abstract
In an example, an apparatus is described that includes a non-resistive heat source, a thermally conductive face, and a temperature detector. The thermally conductive face has a controlled long-wave infrared emissivity and is in thermal contact with the non-resistive heat source. The temperature detector is positioned to detect a temperature of the thermally conductive face.
Claims15
An apparatus, comprising:
- a non-resistive heat source;
- a thermally conductive face having a controlled long-wave infrared emissivity, wherein the thermally conductive face is in thermal contact with the non-resistive heat source;
- and
- a temperature detector positioned to detect a temperature of the thermally conductive face.
A method, comprising:
- determining an expected value describing heat emitted by an emitter face having a known emissivity, based on a measurement of a temperature of the emitter face;
- comparing a measurement taken by a non-contact thermal measurement device to the expected value;
- and
- determining, based on the comparing, whether the non-contact thermal measurement device is functioning properly.
A non-transitory machine-readable storage medium encoded with instructions executable by a processor, the machine-readable storage medium comprising:
- instructions to determine an expected value describing heat emitted by an emitter face having a known emissivity, based on a measurement of a temperature of the emitter face;
- instructions to a measurement taken by a non-contact thermal measurement device to the expected value;
- and
- instructions to determine, based on the comparing, whether the non-contact thermal measurement device is functioning properly.
Dependencies are inferred from the claim text.