Scanning-type x-ray source and imaging system therefor
AssigneeNanovision Technology (Beijing) Co., Ltd
InventorsZhili CUI, Jian GAO, Jinhui XING
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AssigneeNanovision Technology (Beijing) Co., Ltd
InventorsZhili CUI, Jian GAO, Jinhui XING
Estimating the term…
Provided are a scanning-type X-ray source and an imaging system therefor. The scanning-type X-ray source comprises a vacuum cavity (1), wherein a cathode (2) and a plurality of anode target structures (3) are arranged in the vacuum cavity (1); a gate electrode (4) is arranged in a position, close to the cathode (2), in the vacuum cavity (1); a focusing electrode (5) is arranged in a position, close to the gate electrode (4), in the vacuum cavity (1); and a deflection coil (6) is arranged in a position, close to the gate electrode (4), at the outer periphery of the vacuum cavity (1). The scanning-type X-ray source generates electron beams by using cathode (2), controls the powering-on/off of the electron beams by the gate electrode (4), and the deflection coil (6) controls the direction of motion of the electron beams, so as to complete the switching between multiple focuses.
A scanning-type X-ray source, comprising a vacuum cavity, wherein a cathode and a plurality of anode target structures are disposed inside the vacuum cavity, a location close to the cathode inside the vacuum cavity is provided with a grid, a location close to the grid inside the vacuum cavity is provided with a focusing electrode, and a location that is close to the grid and that is on the periphery of the vacuum cavity is provided with a deflection coil;
Dependencies are inferred from the claim text.