System for analyzing impact and puncture resistance
AssigneesDow Global Technologies LLC, Rohm and Haas Company
InventorsDonald L. McCarty, II, Erick Sutanto, John Lund, Brayden E. Glad, Hitendra Singh
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Abstract
A method and a system for analyzing a physical characteristic of a film sample are described herein. The system includes a material holder system configured to hold the film sample; a dart testing system configured to test a physical characteristic of the film sample; and a moving system configured to move the held film sample to be analyzed or tested between stations. The moving system is configured to move the held film sample in the material holder system to the dart testing system.
Claims19
A system for analyzing a physical characteristic of a film sample, the system comprising:
- a material holder system configured to hold the film sample;
- a dart testing system configured to test a physical characteristic of the film sample;
- and
- a moving system configured to move the held film sample to be analyzed or tested between stations,
- wherein the moving system is configured to move the held film sample in the material holder system to the dart testing system.
A method for analyzing a physical characteristic of a film sample, the method comprising:
- holding the film sample by a material holder system connected to a moving system;
- moving the film sample by the moving system to a dart testing system;
- and
- testing a physical characteristic of the film of the material using the dart testing system.
Dependencies are inferred from the claim text.