Particle detector having improved performance and service life
AssigneeAdaptas Solutions Pty Ltd
InventorsRussell Jurek, Kevin Hunter
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Abstract
The present invention relates to generally to components of scientific analytical equipment. More particularly, the invention relates to ion detectors of the type which incorporate electron multipliers and modifications thereto for extending the operational lifetime or otherwise improving performance. The invention may be embodied in the form of a particle detector having one or more electron emissive surfaces and/or an electron collector surface therein, the particle detector being configured such that in operation the environment about the electron emissive surface(s) and/or the electron collector surface is/are different to the environment immediately external to the detector.
Claims35
A particle detector having one or more electron emissive surfaces and/or an electron collector surface therein, the particle detector being configured such that in operation the environment about the electron emissive surface(s) and/or the electron collector surface is/are different to the environment immediately external to the detector.
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An apparatus comprising:
- a particle detector having one or more electron emissive surfaces and/or an electron collector surface therein, the particle detector being configured such that in operation the environment about the electron emissive surface(s) and/or the electron collector surface is/are different to the environment immediately external to the detector;
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- an off-axis input particle optic apparatus in functional association with the particle detector, wherein the off-axis input particle optic apparatus is configured to inhibit or prevent stagnation of a gas about the particle detector.
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A method of determining a rate and/or extent of contaminant deposition on one or more electron emissive surfaces, or on an electron collector of a particle detector, the particle detector comprising one or more electron emissive surfaces and/or an electron collector surface therein, the method comprising:
- assessing an ability of the particle detector or a virtual representation of the particle detector to:
- (a) decrease movement of a contaminant from the environment external the physical or virtual particle detector to the environment about the electron emissive surface(s) and/or the electron collector surface, and/or
- (b) decrease a vacuum conductance of the physical or virtual particle detector.
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Dependencies are inferred from the claim text.