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US 2021/0067147 A1Published application
Pulsed high current technique for characterization of device under test
AssigneeKeithley Instruments, LLC
InventorGregory Sobolewski
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Abstract
A test and measurement circuit including a capacitor in parallel with a device under test, a direct current voltage source configured to charge the capacitor, a pulse generator configured to generate a pulse for testing the device under test, and a sensor for determining a current in the device under test.
Claims20
A test and measurement circuit, comprising:
- a capacitor in parallel with a device under test;
- a direct current voltage source configured to charge the capacitor;
- a pulse generator configured to generate a pulse for testing the device under test;
- and
- a sensor for determining a current in the device under test.
2 more elements
A method for characterizing a device under test, comprising:
- charging a capacitor by a direct current voltage source;
- generating a pulse by a pulse generator for testing the device under test;
- and
- measuring a current through the device under test based on the pulse.
1 more element
Dependencies are inferred from the claim text.