Antiferroelectric memory devices and methods of making the same
AssigneeSanDisk Technologies LLC
InventorsBhagwati PRASAD, Rahul SHARANGPANI
Life of this patent
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Abstract
An antiferroelectric memory device includes at least one antiferroelectric memory cell. Each of the at least one antiferroelectric memory cell includes a first electrode, a second electrode and a stack containing an antiferroelectric layer and a doped semiconductor layer or a ferroelectric layer located between the first and the second electrodes.
Claims20
An antiferroelectric memory device comprising at least one antiferroelectric memory cell, wherein each of the at least one antiferroelectric memory cell comprises:
- a first electrode;
- a second electrode;
- and
- a stack comprising a ferroelectric layer and an antiferroelectric layer located between the first and the second electrodes.
A method of forming a three-dimensional array of antiferroelectric memory array, comprising:
- forming a vertically alternating sequence of electrically conductive layers and insulating layers over a dielectric material layer;
- dividing the vertically alternating sequence into multiple alternating stacks of first electrically conductive lines and insulating layers by forming line trenches through the vertically alternating sequence;
- forming a line trench fill structure including a combination of a symmetry-breaking material rail, an antiferroelectric rail, and an electrically conductive rail within each of the line trenches, wherein the symmetry-breaking material layer comprises a doped semiconductor layer or a ferroelectric layer;
- and
- dividing each line trench fill structure into a row of composite pillar structures, wherein each of the composite pillar structures comprises a U-shaped symmetry-breaking material layer, a U-shaped antiferroelectric layer, and a second electrically conductive line that extends vertically.
Dependencies are inferred from the claim text.