Apparatus and method for analyzing cause of failure due to dielectric breakdown on basis of big data
AssigneesHyundai Motor Company, Kia Motors Corporation
InventorHyun Soo Park
Life of this patent
Estimating the term…
Abstract
An apparatus and a method for analyzing a cause of a failure due to a dielectric breakdown based on big data are provided. A failure cause factor data set, a normal state data set, or a state recovery data set is generated and transmitted to a big data server when a dielectric resistance value is measured to be a minimum normal value or less. A cause of a failure is analyzed by receiving data corresponding to the data sets from the big data server, calculating influence indexes for failure cause factors, and selecting a failure cause factor based on the basis of the influence indexes.
Claims20
An apparatus for analyzing a cause of a failure due to a dielectric breakdown based on big data, comprising:
- a memory configured to store program instructions;
- and
- a processor configured to execute the program instructions, the program instructions when executed configured to:
- monitor whether a dielectric resistance value of a vehicle is decreased to a minimum normal value or less;
- set a failure state section and a normal state section based on a preset reference in response to determining that the dielectric resistance value is a minimum normal value or less, and generate a failure cause factor data set and a normal state data set including a plurality of failure cause factor data for the failure state section and the normal state section;
- transmit the generated data set to a big data server, and receive data corresponding to the data set from the big data server;
- calculate influence indexes for failure cause factors using the received data;
- and
- generate analysis result information by selecting a failure cause factor based on the calculated influence indexes.
A method for analyzing a cause of a failure due to a dielectric breakdown on the basis of big data, comprising:
- monitoring, by a processor, whether a dielectric resistance value of a vehicle is decreased to a minimum normal value or less;
- setting, by the processor, a failure state section and a normal state section according to a preset reference in response to determining that the dielectric resistance value is a minimum normal value or less, and generating a failure cause factor data set and a normal state data set including a plurality of failure cause factor data for the failure state section and the normal state section;
- transmitting, by the processor, the generated data set to a big data server, and receiving data corresponding to the data set from the big data server;
- calculating, by the processor, influence indexes for failure cause factors using the received data;
- and
- generating, by the processor, analysis result information by selecting a failure cause factor based on the calculated influence indexes.
Dependencies are inferred from the claim text.