Methods and Systems for Product Failure Prediction based on X-ray Image Re-examination
AssigneeSVXR, Inc.
InventorsDavid Lewis Adler, Scott Joseph Jewler, Douglas A. Chrissan
Life of this patent
Estimating the term…
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AssigneeSVXR, Inc.
InventorsDavid Lewis Adler, Scott Joseph Jewler, Douglas A. Chrissan
Estimating the term…
In one embodiment, an X-ray inspection system may access a first set of X-ray images of one or more first samples that are labeled as being non-conforming. The system may adjust a classification algorithm based on the first set of X-ray images. The classification algorithm may classify samples into conforming or non-conforming categories based on an analysis of corresponding X-ray images. The system may analyze a second set of X-ray images of a number of second samples using the adjusted classification algorithm. The second samples may be previously inspected samples that have been classified as conforming by the classification algorithm during a previous analysis before the classification algorithm is adjusted. The system may identify one or more of the second samples from the second set of X-ray images. Each identified second sample may be classified as non-conforming by the adjusted classification algorithm.
A method comprising, by an X-ray inspection system:
One or more computer-readable non-transitory storage media embodying software that is operable when executed to:
A system comprising:
A method comprising, by an X-ray inspection system:
One or more computer-readable non-transitory storage media embodying software that is operable when executed to:
A system comprising:
Dependencies are inferred from the claim text.