Memory system and method of operating memory system
AssigneeSK hynix Inc.
InventorJong Wook KIM
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Abstract
The present technology relates to a memory system and a method of operating the memory system. The memory system includes a memory device including a plurality of semiconductor memories, and a controller for controlling the memory device to perform a test program operation and a threshold voltage distribution monitoring operation on each of the plurality of semiconductor memories during an operation. The controller sets operation performance parameters of each of the semiconductor memories based on monitoring information obtained as a result of the threshold voltage distribution monitoring operation.
Claims26
A memory system comprising:
- a memory device including a plurality of semiconductor memories;
- and
- a controller for controlling the memory device to perform a test program operation and a first threshold voltage distribution monitoring operation on each of the plurality of semiconductor memories during an operation,
- wherein the controller sets operation performance parameters of each of the semiconductor memories based on first monitoring information obtained as a result of the first threshold voltage distribution monitoring operation.
A memory system comprising:
- a memory device including a plurality of semiconductor memories each including a plurality of memory blocks;
- and
- a controller configured to control the memory device to perform a content addressable memory (cam) data read operation during a power-on operation and set operation performance parameters of each of the semiconductor memories based on cam data received from the memory device,
- wherein each of the plurality of semiconductor memories sequentially performs a test program operation, a first threshold voltage distribution monitoring operation, a test erase operation, and a second threshold voltage distribution monitoring operation, and stores monitoring information obtained as a result of the first and second threshold voltage distribution monitoring operations in a cam block among the plurality of memory blocks as the cam data.
A method of operating a memory system, the method comprising:
- performing a test program operation and a first threshold voltage distribution monitoring operation on a selected memory block;
- performing a test erase operation and a second threshold voltage distribution monitoring operation on the selected memory block on which the test program operation is performed;
- setting an operation performance parameter of the selected memory block based on a result of the first threshold voltage distribution monitoring operation and a result of the second threshold voltage distribution monitoring operation;
- and
- performing all operations with reference to the operation performance parameter during all operations of the selected memory block.
Dependencies are inferred from the claim text.