Testing read-only memory using memory built-in self-test controller
AssigneeTexas Instruments Incorporated
InventorsPrakash NARAYANAN, Nikita NARESH, Prathyusha Teja INUGANTI, Rakesh Channabasappa YARADUYATHINAHALLI, Aravinda ACHARYA, Jasbir SINGH, Naveen Ambalametil NARAYANAN
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