Voltage measurement device, voltage detection circuit, and device address generation method
AssigneePanasonic Semiconductor Solutions Co., Ltd.
InventorsNaohisa HATANI, Jiro MIYAKE
Life of this patent
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Abstract
A voltage measurement device includes: a plurality of voltage detection circuits which measure cell voltages of a plurality of cells connected in series. Each of the plurality of voltage detection circuits includes: a device address generating circuit which generates a device address according to a first address assignment command received from a preceding voltage detection circuit located at a preceding stage; and an address assignment command generating circuit which generates a second address assignment command according to the first address assignment command, and sends the second address assignment command to a next voltage detection circuit located at a next stage.
Claims16
A voltage measurement device, comprising:
- a plurality of voltage detection circuits which measure cell voltages of a plurality of cells connected in series,
- wherein each of the plurality of voltage detection circuits includes:
- a device address generating circuit which generates a device address according to a first address assignment command received from a preceding voltage detection circuit located at a preceding stage;
- and
- an address assignment command generating circuit which generates a second address assignment command according to the first address assignment command, and sends the second address assignment command to a next voltage detection circuit located at a next stage.
A voltage detection circuit which measures cell voltages of a plurality of cells connected in series, the voltage detection circuit being one of a plurality of voltage detection circuits included in a voltage measurement device, the voltage detection circuit comprising:
- a device address generating circuit which generates a device address according to a first address assignment command received from a preceding voltage detection circuit located at a preceding stage;
- and
- an address assignment command generating circuit which generates a second address assignment command according to the first address assignment command, and sends the second address assignment command to a next voltage detection circuit located at a next stage.
A device address generating method performed by a voltage measurement device which measures cell voltages of a plurality of cells connected in series and includes a plurality of voltage detection circuits, the device address generating method comprising:
- generating a device address according to a first address assignment command received from a preceding voltage detection circuit located at a preceding stage;
- and
- generating a second address assignment command according to the first address assignment command, and sending the second address assignment command to a next voltage detection circuit located at a next stage.
Dependencies are inferred from the claim text.