Wafer bonding method
AssigneeHuaian Imaging Device Manufacturer Corporation
InventorsXian Zhou, Yang Chao, Xiaolu Huang
Life of this patent
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AssigneeHuaian Imaging Device Manufacturer Corporation
InventorsXian Zhou, Yang Chao, Xiaolu Huang
Estimating the term…
A wafer bonding method comprises providing a first wafer and a second wafer, the first wafer having a first metal layer and a first insulating layer at a first surface thereof, the second wafer having a second metal layer and a second insulating layer at a first surface thereof, the first metal layer and the second metal layer comprising a same metal material; pretreating one or both of the first wafer and the second wafer, so that whiskers of the metal material are formed at a surface or surfaces of the one or both of the first metal layer and the second metal layer; and bonding the first metal layer and the second metal layer in a manner that the first metal layer and the second metal layer face each other, to bond the first wafer and the second wafer.
A wafer bonding method comprising:
A wafer bonding method comprising:
Dependencies are inferred from the claim text.