Apparatus and system for modulated plasma systems
AssigneeAdvanced Energy Industries, Inc.
InventorGideon Van Zyl
Life of this patent
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Abstract
Plasma processing systems and methods are disclosed. The plasma processing system includes a high-frequency generator configured to deliver power to a plasma chamber and a low-frequency generator configured to deliver power to the plasma chamber. A filter is coupled between the plasma chamber and the high-frequency generator, and the filter suppresses mixing products of high frequencies produced by the high-frequency generator and low frequencies produced by the low-frequency generator.
Claims27
A plasma processing system comprising:
- a high-frequency generator configured to deliver power to a plasma chamber;
- a low-frequency generator configured to deliver power to the plasma chamber;
- a filter configured to suppress power mixing products to limit variation of a time-varying load reflection coefficient presented to the high frequency generator;
- and
- a frequency-tuning subsystem configured to adjust a frequency of the high-frequency generator to adjust an impedance presented to the high-frequency generator.
A plasma processing system comprising:
- a high-frequency generator configured to deliver power to a plasma chamber;
- a low-frequency generator configured to deliver power to the plasma chamber;
- a filter coupled between the plasma chamber and the high frequency generator, the filter including two or more helical resonators connected in parallel;
- a time delay element between the filter and the plasma chamber;
- and
- a frequency-tuning subsystem configured to adjust a frequency of the high-frequency generator to adjust an impedance presented to the high-frequency generator.
A filter comprising:
- a first helical resonator;
- a second helical resonator connected in parallel with the first helical resonator, wherein the parallel combination of the first and second helical resonators is configured to couple to a high-frequency generator, and the parallel combination of the first and second helical resonators is configured to couple to a low-frequency generator via a plasma load;
- wherein the parallel combination of the first and second helical resonators is configured to suppress power outside of a bandwidth around a frequency of the high-frequency generator;
- wherein the suppression of power at the frequency of the high-frequency generator is at most 2 dB;
- and
- wherein the suppression of power at frequencies more than the frequency of the low-frequency generator from the frequency of the high-frequency generator is at least 2 dB higher than the suppression of power at the frequency of the high-frequency generator.
A filter comprising:
- a first helical resonator comprising a first hollow helical coil;
- a second helical resonator comprising a second hollow helical coil, the second helical resonator coupled in parallel with the first helical resonator;
- and
- wherein each hollow helical coil is coupled to a conductive block that includes a water channel to enable water to flow into the first hollow helical coil, through the conductive block, and out the other hollow helical coil.
Dependencies are inferred from the claim text.