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AssigneeVanguard International Semiconductor Corporation
InventorsSheng-Hui LIANG, Huang-Lang PAI, Chia-Ming HSU, Chia-Lin CHEN
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A reliability determination method, which is configured to test a batch of semiconductor devices, includes: obtaining a Welbull distribution of lifetime of the batch of semiconductor devices; dividing the Welbull distribution into at least a first section and a second section, wherein the first section and the second section meet a confidence interval; generating a first trend line of the first section and a second trend line of the second section according to the first confidence level, in which the first trend line has a first slope and the second trend line has a second slope; determining the first slope exceeds a second slope; and determining a predicted reliability of the batch of the semiconductor device under a target quality level according to the first section.
A reliability determination method for testing a batch of a semiconductor device, comprising:
A storage device accessible to a machine and storing an instruction program, wherein the machine executes the instruction program to perform a reliability determination method, wherein the reliability determination method is configured to test a batch of a semiconductor device, wherein the reliability determination method comprises:
Dependencies are inferred from the claim text.