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US 2020/0348349 A1Published application
Apparatus and methods for testing devices
AssigneeMicron Technology, Inc.
InventorsPaul E. Gregory, Randon K. Richards
Life of this patent
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Abstract
The present disclosure includes apparatuses and methods related to test devices, for example testing devices by measuring signals emitted by a device. One example apparatus can include a first portion including a number of sidewalls positioned to at least partially surround a device under test; and a second portion electrically coupled to the first portion, wherein the second portion is configured to move in the x-direction, the y-direction, and z-direction.
Claims21
-20. (canceled)
An apparatus, comprising:
- a first portion including a number of sidewalls positioned to at least partially surround a device under test;
- and
- a second portion electrically coupled to the first portion, wherein the second portion is configured to move in the x-direction, the y-direction, and z-direction.
An apparatus, comprising:
- a first portion including a number of sidewalls positioned to at least partially surround a device under test;
- a second portion having a number of sidewalls positioned to at least partially surround the first portion and the device under test, wherein the number of sidewalls of the second portion are electrically coupled to the first portion and configured to move in the z-direction with respect to the number of sidewalls of the first portion;
- a third portion positioned on an upper surface of the second portion, wherein the third portion is electrically coupled to second portion and the third portion includes an opening;
- a fourth portion position on an upper surface of the third portion, wherein the fourth portion is electrically coupled to the third portion and the fourth portion is configured to move in the x-direction and the y-direction with respect to the upper surface of the third portion;
- and
- an antenna coupled to the fourth portion.
3 more elements
An apparatus, comprising:
- a first portion coupled to a second portion, wherein the first portion is configured to move in the z-direction with respect to the second portion, wherein the first portion includes a number of sidewalls positioned to surround the second portion and a device under test and wherein the second portion includes a number of sidewalls position to surround the device under test;
- a third portion electrically coupled to the first portion;
- and
- an antenna coupled to the third portion, wherein the third portion and antenna are configured to move in the x-direction and the y-direction with respect to the first portion, wherein the third portion is positioned on the upper surface of the fourth portion.
1 more element
Dependencies are inferred from the claim text.