Supplementary bushing, test probe, and supplementary testing device

A supplementary testing device, for performing an electrical or signal testing of a test object, comprising:

• a base, having a plurality of receiving holes;
• a plurality of test probes, installed in the plurality of receiving holes, and each of the plurality of test probes having a testing end and a connecting end configured to be opposite to each other, and the connecting end being provided to be electrically coupled to a testing machine, and the testing end protruding out from the receiving hole and having a second contact, at least one second fixing portion and a stop portion, and the second contact being disposed at a terminal of the testing end, and the second fixing portion being disposed on an outer surface of the testing end, and the stop portion being disposed at an end of the second fixing portion, and the testing end of each of the plurality of test probes protruding out from the receiving hole for a predetermined length, and the stop portions of the plurality of test probes on the base being disposed on a same level;
• and
• at least one supplementary bushing, having a closed end and an open end configured to be opposite to each other, a receiving groove concavely formed from the open end, and at least one first fixing portion disposed on an inner surface of the receiving groove, and the closed end having a first contact;
• wherein, when the second contact of any one of the plurality of test probes is worn out, the first fixing portion and the second fixing portion are coupled with each other until the supplementary bushing and the stop portion abut each other to stop the positioning, so that the length of the testing end of the plurality of test probe protruding out from the receiving hole resumes the predetermined length.