Test pin contact buffer

A test pin contact buffer, fixedly connected to a test pin base, for the test pin base to perform electrical or signal detection for an object to be tested, the test pin base having at least one test pin, the test pin having a detecting end, characterized by:

• the test pin contact buffer being a sheet-like structure made of a composite material including a conductive material and an insulating material, the test pin contact buffer defining at least one contact area corresponding to the test pin, the contact area having at least one cutout hole, an insulating deformation structure and a conductive head structure, the insulating deformation structure being extendable and made of the insulating material and extending outward from the conductive head structure, the cutout hole enabling the contact area to be in a partial hollow state to facilitate extension and deformation of the insulating deformation structure, a first side of the conductive head structure being in close contact with the detecting end, an opposite second side of the conductive head structure being in contact with the object to be tested when actuated;
• wherein after the test pin contact buffer is mounted to the test pin base, the detecting end of the test pin is pressed against and in contact with the first side of the conductive head structure under normal condition, and the insulating deformation structure is deformed into a three-dimensional shape due to the conductive head structure under stress.