Cantilever probe head and corresponding contact probe

A cantilever probe head, comprising:

• a support ring;
• a PCB board connected to the support ring;
• a support connected to the support ring;
• a plurality of contact probes protruding from the support ring in a cantilever manner and being held by the support connected to the support ring;
• and
• each contact probe having a rod-like probe body with a longitudinal axis inclined with respect to a reference plane corresponding to a plane of a wafer of devices under test by the cantilever probe head and including:
• a first probe section protruding from the support in a direction of the wafer of devices under test and having at least one first end portion;
• a second probe section protruding from the support in an opposite direction with respect to the first probe section towards the PCB board and having a second end portion;
• a contact tip configured to abut onto a contact pad of a device under test of the wafer;
• a further contact end adapted to abut onto a contact pad of the PCB board;
• the first end portion being bent with respect to the longitudinal axis starting from a bending point and ending with the contact tip;
• and
• the second end portion being bent with respect to the longitudinal axis starting from a further bending point and ending with the further contact end,
• wherein the support ring and the support are mounted in pressing contact with the PCB board and the further contact ends of the second end portions of the contact probes abut in a pressing contact onto the contact pads of the PCB board.