Method to Determine Properties of a Coating on a Transparent Film, Method for Manufacturing a Capacitor Film and Device to Determine Properties of a Coating on a Transparent Film

A method for determining properties of a coating on a transparent film, the method comprising:

• moving the transparent film with the coating on a path which passes between a light source and a sensor;
• illuminating, by the light source, the coating on the transparent film;
• detecting, by the sensor, an intensity of transmitted light from the light source;
• and
• calculating, by a processor, the properties of the coating on the transparent film based on the detected intensity of transmitted light.

A method for manufacturing a capacitor film, the method comprising:

• coating of metal on a transparent film;
• moving the transparent film with the coating on a path that passes between a light source and a sensor;
• illuminating, by the light source, the coating on the transparent film;
• detecting, by the sensor, an intensity of transmitted light from the light source;
• calculating, by a processor, properties of the coating on the transparent film based on the detected intensity of transmitted light;
• and
• adapting coating of the metal on the transparent film based on calculating the properties of the coating.

A device comprising:

• a light source configured to illuminate a coating on a transparent film;
• a sensor configured to detect transmitted light intensity through the coating on the transparent film;
• and
• a processor configured to calculate properties of the coating on the transparent film based on the detected intensity of transmitted light which depends on a wavelength of the transmitted light.