Device and Method for Detecting Film Thickness
AssigneeWeihai Hualing Opto-Electronics Co., Ltd.
InventorsLi JIANG, Yonghui LIN, Xiumei QI, Mingfeng SUN
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AssigneeWeihai Hualing Opto-Electronics Co., Ltd.
InventorsLi JIANG, Yonghui LIN, Xiumei QI, Mingfeng SUN
Estimating the term…
A device and method for detecting a film thickness are provided. The device includes: a common electrode, a detection electrode, a common electrode voltage generating circuit, and a detection electrode signal processing circuit. A detection channel for a film to be detected is formed between a first common surface and a first detection surface. The common electrode voltage generating circuit is configured to generate a voltage on the common electrode, as to induce an effective signal voltage on the detection electrode. The detection electrode signal processing circuit includes: a reset voltage time sequence control circuit, a time sequence control circuit for transferring the effective signal voltage on the detection electrode and a differential amplifier.
A device for detecting a film thickness, comprising:
A method for detecting a film thickness, comprising:
Dependencies are inferred from the claim text.