Analysis device
AssigneeHitachi High-Tech Corporation
InventorsTakashi ANAZAWA, Motohiro YAMAZAKI, Taro NAKAZAWA, Michiru FUJIOKA
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AssigneeHitachi High-Tech Corporation
InventorsTakashi ANAZAWA, Motohiro YAMAZAKI, Taro NAKAZAWA, Michiru FUJIOKA
Estimating the term…
In order to avoid crosstalk between images by a simple method, an optical system through which lights emitted from a plurality of light emission points pass, and a measurement unit that measures lights imaged by the optical system are provided, and a midpoint of two arbitrary light emission points among the light emission points is shifted away from a center of the optical system. More specifically, the center of the optical system exists outside a light emission point group consisting of the plurality of the light emission points. With the above configuration, main images and ghost images are separated each other, and thus, it is possible to avoid crosstalk caused by ghosting and to correctly analyze emissions from the plurality of the light emission points.
An analysis device comprising:
An analysis device comprising
Dependencies are inferred from the claim text.