Soc imminent failure prediction using aging sensors

A processing system, comprising:

• a memory comprising computer-executable instructions;
• a processor configured to execute the computer-executable instructions and cause the processing system to perform a method for predicting a failure of an integrated circuit, the method comprising:
• receiving first aging sensor data during an idle state of the integrated circuit;
• determining a voltage compensation value based on the first aging sensor data;
• comparing a new voltage value based on the voltage compensation value to a threshold operating voltage;
• determining the new operating voltage value exceeds the threshold operating voltage;
• determining a warning state for the integrated circuit based on determining the new operating voltage value exceeds the threshold operating voltage;
• receiving second aging sensor data during the idle state of the integrated circuit;
• receiving stored aging sensor data from an aging sensor data repository;
• comparing the second aging sensor data to the stored aging sensor data;
• determining that the second aging sensor data is inconsistent with the stored aging sensor data;
• and
• determining a danger state for the integrated circuit based on determining that the second aging sensor data is inconsistent with the stored aging sensor data.

A non-transitory computer-readable medium comprising instructions that, when executed by a processor of a processing system, cause the processing system to perform a method for predicting a failure of an integrated circuit, the method comprising:

• receiving first aging sensor data during an idle state of the integrated circuit;
• determining a voltage compensation value based on the first aging sensor data;
• comparing a new voltage value based on the voltage compensation value to a threshold operating voltage;
• determining the new operating voltage value exceeds the threshold operating voltage;
• determining a warning state for the integrated circuit based on determining the new operating voltage value exceeds the threshold operating voltage;
• receiving second aging sensor data during the idle state of the integrated circuit;
• receiving stored aging sensor data from an aging sensor data repository;
• comparing the second aging sensor data to the stored aging sensor data;
• determining that the second aging sensor data is inconsistent with the stored aging sensor data;
• and
• determining a danger state for the integrated circuit based on determining that the second aging sensor data is inconsistent with the stored aging sensor data.