Broadband probes for impedance tuners
AssigneeMaury Microwave, Inc.
InventorsM. Tekamül Büber, Sathya Padmanabhan
Life of this patent
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Abstract
A multi-section probe and a tapered probe for impedance tuners to broaden the band width of the probes and hence the band width of the tuners. The multi- section probe and the tapered probe are configured to transform the characteristic impedance of the tuner transmission line step-by-step or continuously to a target impedance value.
Claims18
A probe for a slab line impedance tuner system operable over a frequency bandwidth, the tuner system including opposed slab conductor plates and a center conductor disposed between the slab conductor plates, a probe carriage and a drive system for moving the probe carriage in a longitudinal direction parallel to the center conductor, the probe comprising:
- a plurality of probe sections, wherein each probe section has a different characteristic impedance from every other probe section at some position in the range of the longitudinal directional movement of the probe;
- and
- wherein a number of the probe sections forming the plurality of probe sections is sufficient to provide a desired characteristic impedance transformation for the frequency bandwidth, wherein the characteristic impedance of the tuner system is transformed probe-section by probe-section by the probe to intermediate impedance values to reach a target impedance value.
A slab line impedance tuner system operable over a frequency bandwidth, the tuner system comprising:
- a slab line transmission including opposed slab conductor planes and a center conductor disposed between the slab conductor planes;
- a probe;
- a probe carriage carrying the probe;
- a carriage drive system for moving the probe carriage in a longitudinal direction parallel to the center conductor;
- a probe drive system for moving the probe in a transverse direction relative to the center conductor to position the probe closer to or further away from the center conductor;
- and
- wherein the probe includes:
- a plurality of probe sections, wherein each probe section has a different characteristic impedance from every other probe section at some position in the range of the longitudinal directional movement of the probe;
- and
- wherein a number of the probe sections forming the plurality of probe sections is sufficient to provide a desired characteristic impedance transformation for the frequency bandwidth, wherein the characteristic impedance of the tuner system is transformed probe-section by probe-section by the probe to intermediate impedance values to reach a target impedance value.
A probe for a slab line impedance tuner system operable over a frequency bandwidth, the tuner system including opposed slab conductor planes and a center conductor disposed between the slab conductor planes, a probe carriage and a drive system for moving the probe carriage in a longitudinal direction parallel to the center conductor, the probe comprising:
- a plurality of quarter wavelength, electrically conductive probe sections, each probe section having a nominal length dimension along the longitudinal direction of one quarter wavelength at a frequency at a midpoint of the bandwidth, and wherein each probe section has a cross-sectional profile defining a trough configured to straddle the center conductor as the probe is moved transversely toward the center conductor;
- wherein the probe sections are supported for movement together along the center conductor and in a direction transverse to the center conductor, the probe sections mounted together with no gaps between adjacent probe sections;
- and
- wherein a number of the probe sections forming the plurality of probe sections is sufficient to provide a desired characteristic impedance transformation for the frequency bandwidth, wherein the characteristic impedance of the tuner system is transformed probe-section-by-probe-section by the probe to intermediate impedance values to reach a target impedance value.
Dependencies are inferred from the claim text.