Detecting unreliable bits in transistor circuitry
AssigneeBirad—Research & Development Company Ltd.
InventorsJoseph Shor, Yoav Weizman, Yitzhak Schifmann
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Abstract
A method for detecting unreliable bits in transistor circuitry includes applying a controllable physical parameter to a transistor circuitry, thereby causing a variation in a digital code of a cryptologic element in the transistor circuitry, the variation being a tilt or bias in a positive or negative direction. An amount of variation in the digital code of the cryptologic element is determined. Unreliable bits in the transistor circuitry are defined as those bits for which the variation is in a range defined as unreliable.
Claims16
A method for detecting unreliable bits in transistor circuitry comprising:
- applying a controllable physical parameter to a transistor circuitry, thereby causing a variation in a digital code of a cryptologic element in the transistor circuitry, said cryptologic element comprising a physical unclonable function (PUF), wherein the variation is a tilt or bias in a positive or negative direction;
- determining an amount of variation in the digital code of the cryptologic element;
- and
- establishing unreliable bits in the transistor circuitry as being those bits for which said variation is in a range defined as unreliable and wherein said controllable physical parameter comprises a differential voltage generated by a voltage difference between two different positive supply voltages or two different negative supply voltages.
Dependencies are inferred from the claim text.