Apparatuses and methods for dram wordline control with reverse temperature coefficient delay
AssigneeMicron Technology, Inc.
InventorsYangsung Joo, Hidekazu Noguchi
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AssigneeMicron Technology, Inc.
InventorsYangsung Joo, Hidekazu Noguchi
Estimating the term…
Apparatuses and methods for a temperature dependent delay between a wordline off signal and deactivating the wordline are disclosed. Memory devices may have reduced reliability when operating at relatively cold temperatures, which may be due in part to an increase in the write recovery time while the timing for a wordline to deactivate remains relatively unaffected. In some embodiments of the present disclosure, a delay circuit is used to insert a temperature dependent delay between a wordline off command being issued and the wordline being deactivated. The delay circuit may increase the length of temperature dependent delay at relatively cold temperatures, and decrease the length of the delay at relatively warm temperatures.
An apparatus comprising:
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Dependencies are inferred from the claim text.