Display device and a testing method thereof
AssigneeSamsung Display Co., Ltd.
InventorsKwang Sae Lee, Ji-Hyun Ka, Won Kyu Kwak, Ki Myeong Eom, Hai-Jung In
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Abstract
A display device including: a substrate including a display area and a peripheral area peripheral to the display area; a plurality of pads disposed in a pad area, wherein the pad area is disposed in the peripheral area and the pad area includes an integrated circuit (IC); and a first crack detecting line connected to a first pad and a second pad at a first node, and a third pad at a second node, wherein the first crack detecting line is disposed in the peripheral area between the first node and the second node.
Claims25
A display device, comprising:
- a substrate including a display area and a peripheral area peripheral to the display area;
- a plurality of pads disposed in a pad area, wherein the pad area is disposed in the peripheral area and the pad area includes an integrated circuit (IC);
- and
- a first crack detecting line connected to a first pad and a second pad at a first node, and a third pad at a second node, wherein the first crack detecting line is disposed in the peripheral area between the first node and the second node.
A display device, comprising:
- a substrate including a display area and a peripheral area peripheral to the display area;
- a plurality of pixels disposed in the display area;
- a plurality of pads disposed in the peripheral area;
- a data line including a first end connected to a first pad and a second end connected to a first portion of the pixels;
- and
- a crack detecting line connected to a second pad and a third pad at a first node, and a fourth pad at a second node, wherein the crack detecting line is disposed in the peripheral area between the first node and the second node,
- wherein the data line and the crack detecting line are disposed in the same layer.
A testing method of a display device, wherein the display device includes:
- a substrate including a display area and a peripheral area peripheral to the display area;
- a plurality of pads disposed in a pad area in which an integrated circuit (IC) is disposed;
- and a first crack detecting line connected to a first pad and a second pad at a first node, and a third pad at a second node, wherein the first crack detecting line is disposed in the peripheral area between the first node and the second node, the testing method comprising:
- detecting a resistance of the first crack detecting line by applying a first current to the first pad;
- and
- detecting a resistance of the first crack detecting line by applying a second current that is lower than the first current to the second pad when the resistance of the first crack detecting line exceeds a first threshold.
A display device, comprising:
- a substrate including a display area and a peripheral area peripheral to the display area;
- a plurality of pads disposed in a pad area of the peripheral area;
- and
- a first crack detecting line connected to a first input pad and a second input pad at a first node, and a third output pad and a fourth output pad at a second node,
- wherein a resistance value of the first crack detecting line is detectable by applying different currents to the first crack detecting line via the first and second input pads.
Dependencies are inferred from the claim text.