Mapping Intermediate Material Properties to Target Properties to Screen Materials

A computer readable medium having stored thereon in a non-transitory manner:

• a first database relating each of a plurality of materials for an integrated circuit, with corresponding values for intermediate material properties including bandgap Eg and/or effective mass m*, each of the intermediate material properties being properties which are unaffected by the integrated circuit environment in which the material is used;
• a second database relating each of a plurality of combinations of values for the intermediate properties and values describing potential environments for the material in an integrated circuit, with corresponding target material properties including Band-To-Band Tunneling (BTBT) and Direct Source-to-Drain Tunneling (DSDT);
• and
• a plurality of software code portions defining logic for:
• for each of a plurality of candidate materials, determining values for each of the intermediate material properties by querying the first database;
• for each of a plurality of candidate integrated circuit environments, determining a plurality of target property values of the target property for each particular one of the candidate materials by querying the second database with, in combination, (a) the determined values for the intermediate material properties for the candidate material and (b) values describing each of the candidate integrated circuit environments;
• and
• developing an integrated circuit device using a selected one of the candidate materials selected in dependence upon the plurality of target property values, and a provided layout.

A system for fabricating an integrated circuit,

• for use with a first database relating each of a plurality of materials for an integrated circuit, with corresponding values for intermediate material properties including bandgap Eg and/or effective mass m*, each of the intermediate material properties being properties which are unaffected by the integrated circuit environment in which the material is used,
• for use further with a second database relating each of a plurality of combinations of values for the intermediate properties and values describing potential environments for the material in an integrated circuit, with corresponding target material properties including Band-To-Band Tunneling (BTBT) and Direct Source-to-Drain Tunneling (DSDT), the system comprising:
• a memory;
• a data processor coupled to the memory, the data processor configured to:
• for each of a plurality of candidate materials, determine values for each of the intermediate material properties by querying the first database;
• for each of a plurality of candidate integrated circuit environments, determine a plurality of target property values of the target property for each particular one of the candidate materials by querying the second database with, in combination, (a) the determined values for the intermediate material properties for the candidate material and (b) values describing each of the candidate integrated circuit environments;
• and
• develop an integrated circuit device using a selected one of the candidate materials selected in dependence upon the plurality of target property values, and a provided layout.