US 2020/0089820 A1 · IC TEST INFORMATION MANAGEMENT SYSTEM BASED ON INDUSTRIAL INTERNET

Abstract

The present invention discloses an information management method and system for IC tests, and a storage medium. The method comprises steps of: providing test data generated by performing an IC test by an IC test platform, the IC test platform being an IC test platform having more than one stage, each stage of the IC test platform comprising a plurality of test devices: providing resource data related to the IC test, other than the test data; and analyzing the IC test according to the test data of the IC test and the resource data, to obtain result data related to the IC test. In this way, the present invention can provide technical support for utilizing the value of test data generated in IC tests.

Claims12

Dependent claims

An information management method for IC tests, comprising the steps of:

providing test data generated by performing an IC test by an IC test platform, the IC test platform being an IC test platform having more than one stage, each stage of the IC test platform comprising a plurality of test devices;
providing resource data related to the IC test, other than the test data;
and
analyzing the IC test according to the test data of the IC test and the resource data, to obtain result data related to the IC test.

1 more element

Dependencies are inferred from the claim text.

Facts

Application

16/521,926Filed 25 Jul 2019

Priority

CN 201811075156.014 Sep 2018

Published

19 Mar 2020

Term ends

Not estimatedThe source records don’t support an estimate.

Classification16 codes

G01R 31/2894
Testing of integrated circuits [IC]: aspects of quality control [QC]
G06F 30/3323
Design verification, e.g. functional simulation or model checking: using formal methods, e.g. equivalence checking or property checking
G06F 16/25
Of structured data, e.g. relational data: integrating or interfacing systems involving database management systems
G06F 16/27
Of structured data, e.g. relational data: replication, distribution or synchronisation of data between databases or within a distributed database…

Ic test information management system based on industrial internet

Life of this patent

Ic test information management system based on industrial internet

Life of this patent

Abstract

Claims12