Generating test data based on data value rules of linked data nodes
AssigneeMastercard International Incorporated
InventorsBrett Rosen, Dan Carmody, Stephen Dietz
Life of this patent
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AssigneeMastercard International Incorporated
InventorsBrett Rosen, Dan Carmody, Stephen Dietz
Estimating the term…
The disclosure herein describes generating test data based on a set of linked data nodes and associated data value rules. A plurality of data fields of a data structure is identified. A plurality of linked data nodes is generated based on the identified data fields, wherein each data node comprises a probability value and data value rules for generating data values for the data fields. Parent nodes of the linked data nodes are collapsed into associated child nodes to form combined data nodes. Test data values for the plurality of data fields are generated based on the combined data nodes and a data structure instance is populated with the generated test data values. The populated data structure instance is provided for use in executing tests. The generation of test data based on the data value rules of linked data nodes provides a realistic data environment for testing.
A system for generating test data comprising:
A computerized method for generating test data, the method comprising:
One or more computer storage media having computer-executable instructions for generating test data that, upon execution by a processor, cause the processor to at least:
Dependencies are inferred from the claim text.