Method of determining potential anomaly of memory device

A method of detecting a potential anomaly in in-use performance of a memory device, the method executable at a supervisory entity computer, the supervisory entity computer being communicatively coupled to the memory device, the method comprising:

• over a pre-determined period of time:
• determining a subset of input/output (I/O) operations having been sent to the memory device for processing;
• applying at least one counter to determine an actual activity time of the memory device during the pre-determined period of time, the actual activity time being representative of time the memory device took to process at least some of the subset of I/O operations;
• applying a pre-determined model to generate a benchmark processing time for the at least some of the subset of I/O operations;
• calculating a benchmark processing time for the at least some of the subset of I/O operations;
• generating a performance parameter based on the actual activity time and the benchmark processing time;
• based on an analysis of the performance parameter, determining if the potential anomaly in the in-use performance of the memory device is present with respect to the memory device.

A computer-implemented system for detecting a potential anomaly in a memory device, the system comprising a supervisory entity computer, the supervisory entity computer being communicatively coupled to the memory device, the supervisory entity computer having a processor and a non-transient memory communicatively coupled to the processor, the non-transient memory storing instructions thereon which when executed by the processor cause the supervisory entity computer to, over a pre-determined period of time:

• determine a subset of input/output (I/O) operations having been sent to the memory device for processing;
• apply at least one counter to determine an actual activity time of the memory device during the pre-determined period of time, the actual activity time being an approximation value representative of time the memory device took to process at least a portion of the subset of I/O operations;
• apply a pre-determined model to generate an estimate of a benchmark processing time for each one of the subset of I/O operations;
• calculate a benchmark processing time for the subset of I/O operations;
• generate a performance parameter based on the actual activity time and the benchmark processing time;
• and
• based on an analysis of the performance parameter, determine if the potential anomaly is present in the memory device.