Memory having different reliabilities

Abstract

The disclosure proposes a circuit including a memory which has a multiplicity of memory cells, the memory having a first area and a second area, at least one memory cell comprising a part of the first area and a part of the second area, the first area having a lower reliability than the second area, and the circuit being set up in such a manner that first bits are stored in the first area and second bits are stored in the second area. A circuit for reading the memory and methods for writing to and reading the memory are also disclosed.

Dependencies are inferred from the claim text.