Image sensor, method of controlling image sensor, and electronic device
AssigneeSony Semiconductor Solutions Corporation
InventorsAtsumi Niwa, Tomonori Yamashita, Takashi Moue, Yosuke Ueno
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Abstract
Provided is an image sensor including: a pixel section configured to include a plurality of pixels arranged therein; and an AD conversion unit configured to perform analog-to-digital (AD) conversion on a pixel signal on the basis of a result of comparison between a first voltage of a signal, which is obtained by adding, via capacitances, the pixel signal of the pixel and a reference signal that linearly changes in a direction opposite to the pixel signal, with a second voltage serving as a reference.
Claims20
An imaging device comprising:
- a pixel configured to generate a pixel signal;
- and
- a comparator comprising:
- a first capacitor configured to receive the pixel signal;
- a second capacitor configured to receive a reference signal;
- a node coupled to the first capacitor and the second capacitor;
- a first transistor having a gate coupled to the node;
- a second transistor coupled to the first transistor;
- and
- a third capacitor coupled between a gate of the second transistor and a first line supplied with a first voltage.
An imaging device comprising:
- a pixel configured to generate a pixel signal;
- and
- a comparator comprising:
- a first capacitor configured to receive the pixel signal;
- a second capacitor configured to receive a reference signal;
- a node coupled to the first capacitor and the second capacitor;
- a first transistor having a gate coupled to the node;
- a second transistor disposed between a first line supplied with a first fixed voltage and the first transistor;
- wherein the first transistor is coupled between the second transistor and a second line supplied with a second fixed voltage different from the first fixed voltage, and
- wherein a gate of the second transistor is isolated from the node.
Dependencies are inferred from the claim text.