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US 2020/0052145 A1Published application
Lateral ge/si avalanche photodetector
AssigneeElenion Technologies, LLC
InventorsAri Novack, Yang Liu, Yi Zhang
Life of this patent
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Abstract
A lateral Ge/Si APD constructed on a silicon-on-insulator wafer includes a silicon device layer having regions that are doped to provide a lateral electric field and an avalanche region. A region having a modest doping level is in contact with a germanium body. There are no metal contacts made to the germanium body. The electrical contacts to the germanium body are made by way of the doped regions in the silicon device layer.
Claims21
1-47. (canceled)
An avalanche photodetector, comprising:
- a silicon device layer, comprising:
- a first electrical contact region including a p dopant,
- a germanium contact region,
- an avalanche region,
- a charge region including the p dopant at a lower level of doping than the first contact region, separating the absorption region from the avalanche region, and
- a second electrical contact region including an n dopant;
- a germanium body adjacent to the germanium contact region;
- a first electrical terminal in electrical communication with the first electrical contact region;
- and
- a second electrical terminal in electrical communication with the second electrical contact region;
- whereby electrons, generated in the germanium body, move into the germanium contact region and then to the avalanche region, while holes generated in the germanium body move to the second electrical contact region.
8 more elements
A method of fabricating an avalanche photodiode comprising:
- providing a semiconductor wafer including a silicon device layer;
- producing a first electrical contact region in the silicon device layer by depositing a p dopant therein;
- producing a charge region in the silicon device layer including the p dopant at a lower level of doping than the first contact region, producing a germanium contact region adjacent the first electrical contact region and the charge region;
- producing a second electrical contact region in the silicon device layer including an n dopant, producing an avalanche region adjacent the charge region and the second electrical contact region;
- depositing a germanium body in contact with the germanium contact region;
- applying a first electrical terminal in electrical communication with the first electrical contact region;
- and
- applying a second electrical terminal in electrical communication with the second electrical contact region.
5 more elements
Dependencies are inferred from the claim text.