Multi-Metal Fill with Self-Align Patterning
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsWei-Chen Chu, Tai-I Yang, Cheng-Chi Chuang, Chia-Tien Wu
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsWei-Chen Chu, Tai-I Yang, Cheng-Chi Chuang, Chia-Tien Wu
Estimating the term…
The present disclosure describes methods which employ a patterning photolithography/etch operations to form self-aligned interconnects with multi-metal gap fill. For example, the method includes a first pattern structure and a second pattern structure formed over a dielectric layer. Each of the first and second pattern structures includes a pair of spacers, and a center portion between the pair of spacers. A first opening, self-aligned to a space between the first and second pattern structures, is formed in the dielectric layer. A first conductive material is deposited in the first opening. The center portion of the second pattern structure is removed to form a void above the dielectric layer and between the pair of spacers of the second pattern structure. A second opening, self-aligned to the void, is formed in the dielectric layer; and a second conductive material is deposited in the second opening.
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