Apparatus for chemical mechanical polishing process
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsChih-I PENG, Hsiu-Ming YEH, Yi-Chang LIU
Life of this patent
Estimating the term…
Loading patent…
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsChih-I PENG, Hsiu-Ming YEH, Yi-Chang LIU
Estimating the term…
A system for performing a chemical mechanical polishing (CMP) process is provided. The system includes a CMP tool configured to polish a semiconductor wafer. The processing system further includes a wafer stage configured to support the semiconductor wafer for facilitating the insertion of the semiconductor wafer into, and its subsequent removal from, the CMP tool. The processing system also includes a number of spray nozzles positioned relative to the wafer stage. In addition, the processing system includes a spray generator connected to the spray nozzles and configured to convert a mixture to a mist spray. The processing system further includes a controller configured to activate flow of the mist spray from the spray generator to the spray nozzles to discharge the mist spray over the semiconductor wafer supported by the wafer stage.
A processing system for performing a chemical mechanical polishing (CMP) process, the system comprising:
A processing system for performing a chemical mechanical polishing (CMP) process, the system comprising:
A processing system for performing a chemical mechanical polishing (CMP) process, the system comprising:
Dependencies are inferred from the claim text.