Adjustable sample floor for ultrafast signal washout
AssigneeElemental Scientific Lasers, LLC
InventorsLeif C. Summerfield, Brock Meyer
Life of this patent
Estimating the term…
Abstract
Systems and methods for an adjustable sample floor for ultrafast signal washout are disclosed. In an embodiment. A target support configured to adjustably support a target within a sample chamber may include: a support frame that may configured to be inserted into the sample chamber, a support platform that may be disposed within the support frame, and a platform adjustment system that may be coupled to the support frame and the support platform. The platform adjustment system may be configured to adjust at least one of: a position and an orientation of the support platform relative to the support frame when the support frame is inserted into the sample chamber.
Claims20
A target support configured to adjustably support a target within a sample chamber, comprising:
- a support frame configured to be inserted into the sample chamber;
- a support platform disposed within the support frame;
- and
- a platform adjustment system coupled to the support frame and the support platform, wherein the platform adjustment system is configured to adjust at least one of:
- a position and an orientation of the support platform relative to the support frame when the support frame is inserted into the sample chamber.
The target support of claim Error! Reference source not found, wherein the platform adjustment system configured to adjust at least of the position and the orientation of the support platform further comprises:
- adjusting the support platform along an x-axis, adjusting the support platform along a y-axis, and adjusting the support platform along a z-axis.
The target support of claim Error! Reference source not found, wherein the platform adjustment system further comprises:
- one or more adjustment rods disposed between one or more platform adjustment knobs and a first end of one or more screws, the one or more platform adjustment knobs rotatable to engage the one or screws;
- one or more threaded bores configured to engage threads of the one or more screws, the one or more threaded bores coupled to the support frame by a bracket;
- one or more tip portions connected to a corresponding second end of the one or more screws, the one or more tip portions configured to be displaced along an x-axis when the one or more screws rotates relative to the one or more threaded bores;
- and
- one or more wedges fixes to a lower surface of the support platform, wherein the one or more wedges comprise:
- a relatively thin end, a relatively thick end, and an inclined surface extending from the relatively thin end to the relatively thick end, the one or more wedges configured to change a position of the support platform relative to the support frame.
The target support of claim 2, wherein the one or more wedges comprises a groove provided on the inclined surface and configured to receive a portion of the one or more tip portions.
The target support of claim Error! Reference source not found., wherein a thread pitch and a helix angle of the one or more screws, the thread pitch and the helix angle of the one or more threaded bores, and a slope of the inclined surface of the one or more wedges are configured to modify a position of the support platform in a range from 1 μm to 1 mm along the z-axis per one full rotation of the platform adjustment knob.
The target support of claim Error! Reference source not found., wherein the target support further comprises a systems of rails and grooves configured to partially restrict movement of the support platform along a plane defined by the x-axis and the y-axis.
A method, comprising:
- adjusting a target support configured to support a target within a sample chamber, the target support comprising:
- a support frame configured to be inserted into the sample chamber;
- a support platform disposed within the support frame;
- and
- a platform adjustment system coupled to the support frame and the support platform, wherein the platform adjustment system is configured to adjust at least one of:
- a position and an orientation of the support platform relative to the support frame when the support frame is inserted into the sample chamber.
A sample chamber configured to accommodate a target, comprising:
- a sample chamber body;
- a transmission window;
- a sample capture cell;
- and
- a target support configured to adjustably support the target within the sample chamber, wherein the target support comprises:
- a support frame configured to be inserted into the sample chamber;
- a support platform disposed within the support frame;
- and
- a platform adjustment system coupled to the support frame and the support platform, wherein the platform adjustment system is configured to adjust at least one of:
- a position and an orientation of the support platform relative to the support frame when the support frame is inserted into the sample chamber.
Dependencies are inferred from the claim text.