Sample Carrier and Electron Microscope
AssigneeJEOL Ltd.
InventorShuho Yoshida
Life of this patent
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AssigneeJEOL Ltd.
InventorShuho Yoshida
Estimating the term…
A sample carrier capable of preventing damage to a support stage on which a sample holder is placed while ensuring a sufficient level of conveyance speed includes a sample holder, a holder mounting member, and a transport portion. The transport portion has a drive source (constant-speed motor), a rotary member (second toothed wheel), a guide portion (linear guide), and a rod. The rotary member is rotated about its axis of rotation by the drive source. The guide portion operates to guide the holder mounting member in a linear direction perpendicular to the axis of rotation of the rotary member. The rod is rotatably coupled to the rotary member and to the holder mounting member and has a coupled portion coupled to the rotary member. At a midpoint of the range of movement of the holder mounting member, the shortest distance from the coupled portion to the guide portion is greatest.
A sample carrier comprising:
An electron microscope having an electron beam irradiation portion for irradiating a sample with an electron beam, an electron detection device for detecting electrons emanating from the sample in response to the electron beam irradiation, and a sample carrier for transporting the sample into a position hit by the electron beam, said sample carrier comprising:
Dependencies are inferred from the claim text.