Storage device and operating method thereof
AssigneeSK hynix Inc.
InventorsMin Ho HER, Dong Hyun KIM, Seung Il KIM, Youn Ho JUNG
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AssigneeSK hynix Inc.
InventorsMin Ho HER, Dong Hyun KIM, Seung Il KIM, Youn Ho JUNG
Estimating the term…
In a memory device having improved reliability, the memory device includes: a memory device comprising: a memory cell array including memory cells; a program operation controller configured to perform a program operation on the memory cells to any one state among first to nth states; a voltage generator configured to generate operating voltages respectively corresponding to the first to nth states in the program operation; a verify operation controller configured to verify whether the program operation performed on selected memory cells to a kth state, has been completed, and count a number of over-programmed memory cells having a threshold voltage greater than a threshold voltage corresponding to the kth state among the selected memory cells; and an over-program manager configured to increase operating voltages corresponding to (k+1)th to nth states to be greater than default values according to the number of over-programmed memory cells.
A memory device comprising:
A storage device comprising:
A method for operating a memory device including a plurality of memory blocks each including a plurality of memory cells, the method comprising:
Dependencies are inferred from the claim text.