Non-volatile memory with countermeasures for select gate disturb during program pre-charge
AssigneeSanDisk Technologies LLC
InventorXiang Yang
Life of this patent
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AssigneeSanDisk Technologies LLC
InventorXiang Yang
Estimating the term…
Program disturb is a condition that includes the unintended programming while performing a programming process for memory cells, where the program disturb can affect both memory cells and select gates in a NAND structure. During a pre-charge phase of a programming operation, a drain side select gate may be biased to a higher voltage than an adjacent word line, resulting in a disturb of the select gate due to hot-electron injection. This can raise the threshold voltage of the select gate, causing error in reading the NAND string or even making it inaccessible. To help avoid this problem, during a program pre-charge, the voltage applied to the select gate is raised in a sequence of steps, rather than driving the select gate directly to its final pre-charge voltage level.
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