Inspection system, method of multi-time programming in the same and display device
AssigneeSamsung Display Co., Ltd.
InventorMyoung-Ho KWON
Life of this patent
Estimating the term…
Abstract
An inspection system includes a display device including a nonvolatile memory, an inspection device configured to generate a writing voltage for application to the nonvolatile memory, and a protection part configured to apply the writing voltage to the nonvolatile memory when the writing voltage is within an allowable voltage range, and not to apply the writing voltage to the nonvolatile memory when the writing voltage is not within the allowable voltage range. The application of the writing voltage to the nonvolatile memory enables a multi-time programming (MTP) operation in which reference data writes to the nonvolatile memory.
Claims20
An inspection system comprising:
- a display device comprising a nonvolatile memory;
- an inspection device configured to generate a writing voltage for application to the nonvolatile memory;
- and
- a protection part configured to apply the writing voltage to the nonvolatile memory when the writing voltage is within an allowable voltage range, and configured not to apply the writing voltage to the nonvolatile memory when the writing voltage is not within the allowable voltage range, the application of the writing voltage to the nonvolatile memory enabling a multi-time programming (MTP) operation in which reference data writes to the nonvolatile memory.
A method of multi-time programming (MTP) reference data to a nonvolatile memory in a display device, the method comprising:
- generating a writing voltage for writing to the nonvolatile memory;
- applying the writing voltage to the nonvolatile memory when the writing voltage is within an allowable voltage range;
- and
- not applying the writing voltage to the nonvolatile memory when the writing voltage is not within the allowable voltage range.
A display device comprising:
- a display part comprising a plurality of pixels;
- a nonvolatile memory;
- and
- a protection part configured to receive a writing voltage for application to the nonvolatile memory, the protection part configured to apply the writing voltage to the nonvolatile memory when the writing voltage is within an allowable voltage range, and configured not to apply the writing voltage to the nonvolatile memory when the writing voltage is not within the allowable voltage range, the application of the writing voltage to the nonvolatile memory enabling a multi-time programming (MTP) operation in which reference data writes to the nonvolatile memory.
Dependencies are inferred from the claim text.