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US 2020/0051176 A1Published application
Analysis system
AssigneeNEC Corporation
InventorsJianquan LIU, Shoji NISHIMURA, Yasufumi HIRAKAWA
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Abstract
According to the present invention, an analysis system (10) including a generation unit (11) that generates frequency data indicating a temporal change in an occurrence frequency of a predetermined event for each processing object, and an extraction unit (12) that extracts the processing object having a first feature appearing in the frequency data as a possible abnormal object is provided.
Claims22
An analysis system comprising:
- at least one memory configured to store one or more instructions;
- and
- at least one processor configured to execute the one or more instructions to:
- generate frequency data indicating a temporal change in an occurrence frequency of a predetermined event for each processing object;
- and
- extract the processing object having a first feature appearing in the frequency data as a possible abnormal object.
3 more elements
The analysis system according to claim 6,
- wherein the second feature commonly applied to all processing objects is a feature appearing in the frequency data of a plurality of the processing objects.
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Dependencies are inferred from the claim text.