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US 2020/0049761 A1Published application
Spring probe with geometric stacking method
OwnerPang-Chih Liu, Chao-Chi Penginventors
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Abstract
An elastic probe device comprising an insulating substrate and a set of probes, the insulating substrate having signal input and output contacts, the probes being adhered to the contacts on the insulating substrate and perpendicular to the insulating substrate, the probes being stacked up to a required height with triangular modules and circular modules, wherein the triangular modules are stacked at different angles to form a set of elastic probe device.
Claims3
An elastic probe device, comprising:
- an insulating substrate, the insulating substrate having signal input and output contacts;
- and a set of probes, the probes being adhered to the insulating substrate, the probe having a plurality of triangular modules and a plurality of circular modules.
Dependencies are inferred from the claim text.