Measurement device, measurement system, measurement method, and program
AssigneeZensho Holdings Co., Ltd.
InventorSeiichi Mizuno
Life of this patent
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AssigneeZensho Holdings Co., Ltd.
InventorSeiichi Mizuno
Estimating the term…
A measurement device includes a sensor unit capable of measuring a state of a measurement target, and a control unit configured to control the sensor unit. The sensor unit includes a measurement unit capable of measuring a voltage corresponding to the state of the measurement target, a first voltage comparison unit configured to determine whether or not the measured voltage is changed beyond a lower limit value of a predetermined voltage change, and a second voltage comparison unit configured to determine whether or not the voltage change is changed beyond an upper limit value of the voltage change. The control unit stops power supply to the sensor unit in a case in which it is determined in the first and second voltage comparison units that the measured voltage is not changed beyond the voltage change.
1-10. (canceled)
A measurement device comprising:
A measurement system comprising:
A measurement method comprising:
A non-transitory computer readable medium storing a program therein, the program causing a computer to execute:
Dependencies are inferred from the claim text.