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US 2020/0049667 A1Published application
Method and device for examining a sample
AssigneeBundesrepublik Deutschland, vertreten durch den Bundesminister für Wirtschaft und Energie
InventorsChristoph Strangfeld, Stefan Maack
Life of this patent
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Abstract
A method for examining a sample (50) including the steps of exciting a propagating mechanical deformation (2) in the sample (50) using a fluidic oscillator (10), and determining a characteristic of the mechanical deformation (2).
Claims21
1-15. (canceled)
A method for examining a sample, the method comprising:
- exciting a propagating mechanical deformation in the sample using a fluidic oscillator;
- and
- determining a characteristic of the mechanical deformation.
A device for examining a sample, comprising:
- a fluidic oscillator for generating an excitation signal for the sample;
- a detector for detecting an excitation of the sample which can be generated by the excitation signal;
- and
- an evaluation unit, which can be coupled to the detector and is configured to obtain data generated by the detector during the detection of the excitation.
1 more element
Use of a fluidic oscillator for exciting a mechanical deformation propagating in a sample, in particular a sound wave, during an examination of the sample.
Dependencies are inferred from the claim text.