Measurement apparatus and measurement method
AssigneeOlympus Corporation
InventorMiyuki MURAKAMI
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AssigneeOlympus Corporation
InventorMiyuki MURAKAMI
Estimating the term…
A measurement apparatus includes: a projector configured to project pulse light or light whose intensity is periodically modulated onto a subject; an imaging sensor that includes a plurality of pixels, the imaging sensor being configured to image backscattered light of the light projected by the projector from the subject a plurality of times to output a plurality of image signals; a selection circuit configured to select, for each of the pixels, an image signal closest to a reference light amount from the plurality of image signals; and a characteristic calculation circuit configured to calculate, for each of the pixels, TOF information obtained when the image signal selected by the selection circuit is imaged, acquire light intensity information of the light projected by the projector, and calculate a characteristic of the subject based on the calculated TOF information and the acquired light intensity information.
A measurement apparatus, comprising:
A measurement apparatus, comprising:
A measurement method executed by a measurement apparatus that includes an imaging sensor including a plurality of pixels and measures a characteristic of a subject, the method comprising:
A measurement method executed by a measurement apparatus that includes an imaging sensor including a plurality of pixels and measures a characteristic of a subject, the method comprising:
Dependencies are inferred from the claim text.